by Reinhard Schemmel, Simon Althoff, Michael Brökelmann, Andreas Unger, Matthias Hunstig, Walter Sextro
Abstract:
Ultrasonic wire bonding is used to connect the electrical terminals of semiconductor modules in power electronics. Mul- tiple influencing factors in wedge/wedge bonding are known and extensively investigated. A constructively settable but rarely examined parameter is the bonding frequency. In case of bonding on challenging substrates, e.g. supple substruc- tures, a high influence of the working frequency is observed. The choice of the working frequency is typically based on experimental investigations for a certain component or substrate and needs to be evaluated anew for new applications. A profound understanding of the influence of the working frequency is required to achieve a reliable bond process and a short process development. Here a generalized model for the numerical simulation of the bond formation with respect to the dynamics of the substructure is presented. The simulation results are compared to experiments using 300 µm copper wire at different working frequencies and geometries of the substructure.
Reference:
Schemmel, R.; Althoff, S.; Brökelmann, M.; Unger, A.; Hunstig, M.; Sextro, W.: Effects of different working frequencies on the joint formation in copper wire bonding. CIPS 2018 - 10th International Conference on Integrated Power Electronics Systems (CIPS 2018), 2018. (Preprint: https://groups.uni-paderborn.de/ldm/publications/download/Schemmel2018.pdf)
Bibtex Entry:
@INPROCEEDINGS{Schemmel2018,
author = {Schemmel, Reinhard AND Simon Althoff AND Michael {Br{\"o}kelmann}
AND Andreas Unger AND Matthias Hunstig AND Sextro, Walter},
title = {Effects of different working frequencies on the joint formation in
copper wire bonding},
booktitle = {CIPS 2018 - 10th International Conference on Integrated Power Electronics
Systems (CIPS 2018)},
year = {2018},
pages = {230-235},
address = {Stuttgart, Germany},
month = {März},
abstract = {Ultrasonic wire bonding is used to connect the electrical terminals
of semiconductor modules in power electronics. Mul-
tiple influencing factors in wedge/wedge bonding are known and extensively
investigated. A constructively settable but
rarely examined parameter is the bonding frequency. In case of bonding
on challenging substrates, e.g. supple substruc-
tures, a high influence of the working frequency is observed. The choice
of the working frequency is typically based on
experimental investigations for a certain component or substrate and
needs to be evaluated anew for new applications. A
profound understanding of the influence of the working frequency is
required to achieve a reliable bond process and a
short process development. Here a generalized model for the numerical
simulation of the bond formation with respect to
the dynamics of the substructure is presented. The simulation results
are compared to experiments using 300 µm copper
wire at different working frequencies and geometries of the substructure.},
comment = {Preprint: \url{https://groups.uni-paderborn.de/ldm/publications/download/Schemmel2018.pdf}},
file = {Schemmel2018.pdf:download\\Schemmel2018.pdf:PDF},
owner = {ekubi},
timestamp = {2018.04.16}
}