Improving the bond quality of copper wire bonds using a friction model approach (bibtex)
by Simon Althoff, Jan Neuhaus, Tobias Hemsel, Walter Sextro
Abstract:
In order to increase mechanical strength, heat dissipation and ampacity and to decrease failure through fatigue fracture, wedge copper wire bonding is being introduced as a standard interconnection method for mass production. To achieve the same process stability when using copper wire instead of aluminum wire a profound understanding of the bonding process is needed. Due to the higher hardness of copper compared to aluminum wire it is more difficult to approach the surfaces of wire and substrate to a level where van der Waals forces are able to arise between atoms. Also, enough friction energy referred to the total contact area has to be generated to activate the surfaces. Therefore, a friction model is used to simulate the joining process. This model calculates the resulting energy of partial areas in the contact surface and provides information about the adhesion process of each area. The focus here is on the arising of micro joints in the contact area depending on the location in the contact and time. To validate the model, different touchdown forces are used to vary the initial contact areas of wire and substrate. Additionally, a piezoelectric tri-axial force sensor is built up to identify the known phases of pre-deforming, cleaning, adhering and diffusing for the real bonding process to map with the model. Test substrates as DBC and copper plate are used to show the different formations of a wedge bond connection due to hardness and reaction propensity. The experiments were done by using 500 $\mu$m copper wire and a standard V-groove tool.
Reference:
Althoff, S.; Neuhaus, J.; Hemsel, T.; Sextro, W.: Improving the bond quality of copper wire bonds using a friction model approach. Electronic Components and Technology Conference (ECTC), 2014 IEEE 64th, 2014.
Bibtex Entry:
@INPROCEEDINGS{Althoff2014,
  author = {Althoff, Simon and Neuhaus, Jan and Hemsel, Tobias and Sextro, Walter},
  title = {Improving the bond quality of copper wire bonds using a friction
	model approach},
  booktitle = {Electronic Components and Technology Conference (ECTC), 2014 IEEE
	64th},
  year = {2014},
  pages = {1549-1555},
  month = {May},
  abstract = {In order to increase mechanical strength, heat dissipation and ampacity
	and to decrease failure through fatigue fracture, wedge copper wire
	bonding is being introduced as a standard interconnection method
	for mass production. To achieve the same process stability when using
	copper wire instead of aluminum wire a profound understanding of
	the bonding process is needed. Due to the higher hardness of copper
	compared to aluminum wire it is more difficult to approach the surfaces
	of wire and substrate to a level where van der Waals forces are able
	to arise between atoms. Also, enough friction energy referred to
	the total contact area has to be generated to activate the surfaces.
	Therefore, a friction model is used to simulate the joining process.
	This model calculates the resulting energy of partial areas in the
	contact surface and provides information about the adhesion process
	of each area. The focus here is on the arising of micro joints in
	the contact area depending on the location in the contact and time.
	To validate the model, different touchdown forces are used to vary
	the initial contact areas of wire and substrate. Additionally, a
	piezoelectric tri-axial force sensor is built up to identify the
	known phases of pre-deforming, cleaning, adhering and diffusing for
	the real bonding process to map with the model. Test substrates as
	DBC and copper plate are used to show the different formations of
	a wedge bond connection due to hardness and reaction propensity.
	The experiments were done by using 500 $\mu$m copper wire and a standard
	V-groove tool.},
  doi = {10.1109/ECTC.2014.6897500},
  file = {Althoff2014.pdf:Althoff2014.pdf:PDF},
  keywords = {adhesion;circuit reliability;deformation;diffusion;fatigue cracks;friction;interconnections;lead
	bonding;van der Waals forces;Cu;adhering process;adhesion process;ampacity
	improvement;bond quality improvement;cleaning process;diffusing process;fatigue
	fracture failure;friction energy;friction model;heat dissipation;mechanical
	strength;piezoelectric triaxial force sensor;predeforming process;size
	500 mum;total contact area;van der Waals forces;wedge copper wire
	bonding;Bonding;Copper;Finite element analysis;Force;Friction;Substrates;Wires}
}