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The CAD laboratory is equipped with powerful Linux workstations.

The Cadence Design Framework II as well the Advanced Design System of Agilent, respectively, are running.

 

The Cascade wafer probe station RF-1 is used for on-wafer characterisation up to 110 GHz.

 

 

A 50 GHz generator HP 83650 L accompanied by the multiplier modules HP 83557 A and HP 83558 A, all of Agilent, enable sine wave generation up to frequencies of 110 GHz.

 

The sampling oscilloscope DCA 86100 A can be used for the characterisation of 4 signals up to 50 GHz.

 

Signals in the frequency range up to 200 MHz can be analysed by the Agilent real time oscilloscope DSO 3202 A.

 

A system for generation of programmable or pseudo-random bit sequences up to 43.5 Gbit/s of Anritsu consisting of the

†† ††††††

12.5 Gbit/s 4-channel generator MP 1758 A and the 43.5 Gbit/s 4:1 multiplexer MP 1801 A

is available.

 

Error rate measurements up to 12.5 Gbit/s are enabled

by the Agilent Error Detector MP 1764 C.

 

 

For frequency domain characterisation up to 40 GHz

the vectorial network analyser 37369D and the spectrum analyser MS 2668 C

both of Anritsu are used.